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Climate chamber manufacturers for temperature and environmental testing, offers the ideal solution for thermal or climatic testing, simulation and exposure to weather, temperature cycles, aging testing and stress testing.Select the type of test and the area of application, create your own environment!

Walk In Test Chamber For CATL Battery

Walk In Test Chamber For CATL Battery

CATL  Battery Walk In Test Chamber

JOEO Walk In Test Chamber's temperature cyclic stress screening is to change the external environmental stress by using the temperature acceleration technique (the product produces alternating expansion and contraction when circulating in the upper and lower extreme temperatures) under the design strength limitation, so as to generate thermal stress and strain in the product.

It can set different stress screening temperature change rate 5℃/min,10℃/min,15℃/min,20℃/min 
Walk In test chamber(ESS chamber) is suitable for the whole product, parts and materials for high temperature, low temperature, high and low temperature cycling & temperature stress screening (ESS) test and constant humidity and cyclic damp heat test.
Drop Tester Drop Test in Packaging

Drop Tester Drop Test in Packaging

JOEO Package drop tester is suitable for free fall testing of small consumer electronic products and components such as mobile phones, walkie-talkies, electronic dictionaries, CD/MD/MP3, and applicable to JISC 0044 and IEC 60068-2-32.
Selection of structural materials: the drop testing machine provides a basis for the cushioning and vibration reduction design of the product
Evaluation method: falling naked or falling with the package; Check the impact resistance of the product or damage caused by falling during transportation.
Improving product quality: an indispensable means of inspection
Scope of application: electronic products research, development, quality control, manufacturing and other links.
Accuracy are strictly designed by JOEO “1G+”.
 Sand Dust Test Chamber GOST20.57.306-98

Sand Dust Test Chamber GOST20.57.306-98

Provide sand and dust climate environment test device, used in the laboratory to simulate sand blowing environment, assess the adaptability of military mechanical equipment, mechanical, electrical, electronic, electrochemical and electromechanical equipment exposed to dry sand and dust conditions, and evaluate the ability of equipment to resist dust and store and work under sand and dust conditions. The product is implemented in strict accordance with the military standard GOST20.57.306-98, and the materials used have good corrosion resistance and high temperature resistance, ensuring stability in extreme environments.

Liquid To Liquid Thermal Shock Chamber

Liquid To Liquid Thermal Shock Chamber

Liquid-to-liquid thermal shock test chambers are often used to test electronic components by abruptly and repeatedly moving them from a container containing a hot liquid to a container containing a cold liquid to withstand strong shocks. The liquid used remains physically unchanged within the temperature range of the climate chamber, subjecting the DUT (device under test) to a strong shock to test its resistance.
Semiconductor Dry Oven

Semiconductor Dry Oven

JOEO stacked semiconductor dry oven have earned a long-standing reputation for outstanding performance, long service life and ease of operation in a variety of applications. Semiconductor ovens feature high capacity horizontal air recirculation systems that maximize temperature uniformity and performance for curing, drying, and baking in semiconductors, electronics, and many other industrial applications. Stacked structures use space to increase productivity and are ideal for mass production applications.
PCB Drying Oven

PCB Drying Oven

PCB (printed circuit board) drying Oven oven is an industrial oven used to cure or bake electronic components. PCB dry oven is a controllable oven that can cure the epoxy resin or solder resistance coated on the surface of the PCB and remove the internal moisture, which is widely used in the electronics manufacturing industry for drying electronic components (printed circuit boards), curing coatings, adhesives and other materials.

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  • Walk In Test Chamber For CATL Battery

    Walk In Test Chamber For CATL Battery

    CATL  Battery Walk In Test Chamber

    JOEO Walk In Test Chamber's temperature cyclic stress screening is to change the external environmental stress by using the temperature acceleration technique (the product produces alternating expansion and contraction when circulating in the upper and lower extreme temperatures) under the design strength limitation, so as to generate thermal stress and strain in the product.

    It can set different stress screening temperature change rate 5℃/min,10℃/min,15℃/min,20℃/min 
    Walk In test chamber(ESS chamber) is suitable for the whole product, parts and materials for high temperature, low temperature, high and low temperature cycling & temperature stress screening (ESS) test and constant humidity and cyclic damp heat test.